Impact Echo

Impact Echo (IE)

Method Brief
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Impact Echo

The Impact Echo (IE) method is used for rapid flaw detection and thickness evaluation of concrete and masonry structural materials.

  • Applicable for parallel to subparallel flaws from the surface in plate-like objects such as slabs, walls, columns, mat foundations, beams
  • One-sided testing
  • Flaw location and depth
  • Thickness profiling without the need to drill, core or excavate

Impact Echo Scanning

A variation of the impact echo principle is the Impact Echo Scanning (IES) method.

  • Patented technology of a rolling transducer and automated impactor for near-continuous IE testing
  • Fast-acquiring IE testing (1000 points/hour)
  • Best for high resolution imaging of large areas for internal concrete conditions
  • Example applications: slab thickness profiling and flaw detection, pavement testing, location of ungrouted sections of post-tensioning ducts
  • Read a paper on the IES, as applied to PT duct void location

Applicable on:

  • Floors
  • Beams
  • Runways
  • Tunnels
  • Dams
  • Columns
  • Walls
  • Pavements
  • Slabs up to 24 Inches (60 Centimeters) Thick

Test for:

  • Thickness and Internal Cracks
  • Voids
  • Honeycomb
  • Delaminations

The IE & IES Test Systems

The Impact Echo (IE) system is designed to determine the condition and thickness of concrete, wood, stone, and masonry structural members when voids, honeycomb, and/or cracks are suspected.

  • High Data Acquisition
    • Thousands of tests can be performed per hour when “imaging” of internal concrete conditions is required
  • Convenience
    • Only one side of the structure needs to be accessible for testing
  • Rapid Testing
    • Rapid flaw detection and thickness evaluation
  • Testing Specificity
    • The IE method provides information on the depth of a flaw or defect, in addition to mapping its lateral location and extent
  • Variety of Materials
    • This system can be used on concrete, stone, and masonry materials
Buy the Olson IE System
Buy the Olson IES System

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